Purpose: To evaluate the long-term cumulative implant survival rate (CISR%) and cumulative implant–crown success rate (CICSR%) of single–tooth Morse–taper connection implants, with particular attention to documenting the incidence of prosthetic complications. Methods: The customized records of all patients who had been treated with single–tooth Morse–taper connection implants in two dental centers during the period between January 2002 and December 2012 were revisited. These records included patient–related (gender, age at surgery, smoking, bruxism), implant–related (date of insertion, site/location and length/diameter of the implant, previous/concomitant bone regeneration) and restoration–related (date of delivery of the provisional and final crown) information. In addition, these records contained information about any implant failure and biologic and/or prosthetic complication that occurred during the follow–up period as well as the radiographic documentation. The follow–up period comprised between 5 and 15 years. The main outcomes were CISR% and CICSR%, with the latter being defined as the condition in which no complication had affected the surviving implant–supported crown during the entire follow–up. Life–table analysis was used for the analysis of CISR% and CICSR%. Peri–implant marginal bone resorption (PIMBR) at 5, 10, and 15 years was a secondary outcome of this study. Results: In total, 578 patients who had received 612 implants were included in this study. The overall CISR% at 15 years was 94.8% (94.2% maxilla, 95.3% mandible). Among the surviving crowns, the overall CICSR% at 15 years was 94.5% (93.1% and 94.9% for anterior and posterior crowns, respectively) and the incidence of prosthetic complications was low (1.5%). PIMBL amounted to 0.38 ± 0.29 mm, 0.49 ± 0.35 mm, and 0.94 ± 0.58 mm, at the 5–, 10–, and 15–year follow–ups, respectively. Conclusions: Morse–taper connection implants represent a reliable treatment procedure for the restoration of single–tooth gaps in the long term, with high CISR% (94.8%) at 15 years, a very low incidence of complications, and a high CICSR% (94.5%).

Prosthetic Complications Affecting Single-Tooth Morse-Taper Connection Implants

Brucoli, Matteo;Mortellaro, Carmen;
2018-01-01

Abstract

Purpose: To evaluate the long-term cumulative implant survival rate (CISR%) and cumulative implant–crown success rate (CICSR%) of single–tooth Morse–taper connection implants, with particular attention to documenting the incidence of prosthetic complications. Methods: The customized records of all patients who had been treated with single–tooth Morse–taper connection implants in two dental centers during the period between January 2002 and December 2012 were revisited. These records included patient–related (gender, age at surgery, smoking, bruxism), implant–related (date of insertion, site/location and length/diameter of the implant, previous/concomitant bone regeneration) and restoration–related (date of delivery of the provisional and final crown) information. In addition, these records contained information about any implant failure and biologic and/or prosthetic complication that occurred during the follow–up period as well as the radiographic documentation. The follow–up period comprised between 5 and 15 years. The main outcomes were CISR% and CICSR%, with the latter being defined as the condition in which no complication had affected the surviving implant–supported crown during the entire follow–up. Life–table analysis was used for the analysis of CISR% and CICSR%. Peri–implant marginal bone resorption (PIMBR) at 5, 10, and 15 years was a secondary outcome of this study. Results: In total, 578 patients who had received 612 implants were included in this study. The overall CISR% at 15 years was 94.8% (94.2% maxilla, 95.3% mandible). Among the surviving crowns, the overall CICSR% at 15 years was 94.5% (93.1% and 94.9% for anterior and posterior crowns, respectively) and the incidence of prosthetic complications was low (1.5%). PIMBL amounted to 0.38 ± 0.29 mm, 0.49 ± 0.35 mm, and 0.94 ± 0.58 mm, at the 5–, 10–, and 15–year follow–ups, respectively. Conclusions: Morse–taper connection implants represent a reliable treatment procedure for the restoration of single–tooth gaps in the long term, with high CISR% (94.8%) at 15 years, a very low incidence of complications, and a high CICSR% (94.5%).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11579/95300
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